台车式老化测试系统 |
◆ 液晶模組老化測試系統:
Batch Type Oven
Cart Type Aging System
Drawer Type Aging System
Tunnel Type Aging System
TFT LCM In-Line System Design
◆ 液晶模組訊號系統:
Pattern Generator (LVDS, TTL)
Signal Distributor (LVDS, TTL, NTSC)
LVDS/TMDS/TTL Signal Conversion Card
1”~2.5” TFT/OLED Module Measurement/Signal Generator
3”~4” LCM Aging System (TTL/CCIR)
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Cart Type Aging System -- Type II |
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| Capacity:32 pc 17” LCM / 16 pc 20” LCM |
| 1 PG/Cart;Distribute to 32 LVDS Output |
| Signal Interface:LVDS |
| VDD:3.3/5/12V @3A |
| IDD OCP:Selectable 0.5~3.0A,step 0.2A |
| Resolution:VGA~WUXGA、User Define |
| Models Num.:12 |
| Patterns Num.:32 |
| OP Mode:Auto/Manual |
| VBL:12/24V @6A |
| Low Cost、Easy to Use |
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Draw Type Aging Chamber |
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| Capacity:240 pc 17” LCM |
| Signal Interface:LVDS |
| VDD:3.3/5/12V/CH4 (user define) @3A |
| VBL:12/24/Adj. V @5A |
| IDD OCP:Selectable 0.5~3.0A,step 0.1A |
| Resolution:VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models:24 |
| Patterns:32 |
| OP Mode:Auto/Manual |
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Batch Type Oven |
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| Capacity:80 LCM(15”) ~ 8 LCM(57”) |
| 5 PG Card/Oven;able to light on 5 models at the same time |
| VDD:3.3/5/12V/CH4 (user define) @3A |
| VBL:12/24V @10A max. |
| IDD OCP:Selectable 0.5~3.0A,step 0.2A |
| Resolution:VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models:24 |
| Patterns:32 |
| OP Mode:Auto/Manual |
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Tunnel Type Aging System |
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| Capacity:180 LCM(37”) ~ 360 LCM(23”) |
| 15 Cart/Chamber |
| VDD:3.3/5/12V @3A |
| VBL:VBL:12/24V @10A max. |
| IDD OCP:Selectable 0.5~3.0A,step 0.1A |
| IBL OCP:Selectable 0.5~10.0A,step 0.2A |
| Resolution:VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models:24 |
| Patterns:32 |
| CIM system |
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KX-405 Pattern Generator |
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| Resolution:VGA ~WUXGA、User Define |
| Output:LVDS / TMDS |
| Dot Clock:100MHz Max,100KHz step |
| VDD:Programmable 3.0~18V @ 3A step 0.1V |
| IDD OCP:Selectable 0.5~3.0A,step 0.1A |
| Models:24 |
| Patterns:32 |
| Gray Scale Scrolling Pattern |
| Defect Allocation Cursor |
| VBL:Internal 12V @5A / External CH2 |
| VFL:0~5V Inverter Brightness Dimming |
| EDID Read/Edit/Write Function |
| Remote Controller |
| PC Interface:RS-232 |
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OLBI |
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| Size:14” ~ 32” |
| View Angle:Adjustable 60。~ 80。 |
| Adjustable Brightness :7000 nits max. |
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1.8”~12” LCM Aging System |
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| Signal Source:DVD Player |
| Interface:NTSC |
| Capacity:8 LCM/Tray |
| VCC:12V |
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Small Size TFT LCM Tester |
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| Interface:TTL |
| Data width:24 bit |
| VCC:2.5~5.0 Adjustable |
| VBL:1.2~5V Adjustable |
| ICC、IBL Measurement |
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